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Updated: Apr 13, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Chibum Lee1, Srinivasa M Salapaka2
1Department of Mechanical System Design Engineering, Seoul National University of Science and Technology, Seoul 139-743, South Korea.
A new robust control method enhances imaging speed for dynamic mode atomic force microscopy. This model-based approach improves performance over traditional methods, as confirmed by experimental results.
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