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Updated: Apr 13, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Model based control of dynamic atomic force microscope
Chibum Lee1, Srinivasa M Salapaka2
1Department of Mechanical System Design Engineering, Seoul National University of Science and Technology, Seoul 139-743, South Korea.
Abstract:
A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H(∞) control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.
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