Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.8K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.8K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Quantum Spin-1/2 Rings Built From [2]Triangulene Molecular Units.

Angewandte Chemie (International ed. in English)·2026
Same author

Tracing the origin of the tobacco BY-2 cell line.

Protoplasma·2026
Same author

Beyond the Solid Solution: Ordered Enantiomerically Unbalanced Packing in Surface-Confined Tetrahelicene Monolayers.

Chirality·2026
Same author

On-surface synthesis and interfacial charge redistribution of open-shell [3]triangulene-fused porphyrins on Au(111).

National science review·2026
Same author

π-Enlargement in Porphyrin Macrocycles at Interfaces.

Angewandte Chemie (International ed. in English)·2026
Same author

Spin State in Au Porphyrins Modulated by Charge Transfer on Au(111).

Journal of the American Chemical Society·2026

Related Experiment Video

Updated: Apr 13, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

10.4K

Force-Driven Single-Atom Manipulation on a Low-Reactive Si Surface for Tip Sharpening.

Jan Berger1,2, Evan J Spadafora1, Pingo Mutombo1

  • 1Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, CZ-16200, Prague, Czech Republic.

Small (Weinheim an Der Bergstrasse, Germany)
|May 6, 2015
PubMed
Summary
This summary is machine-generated.

Atomic manipulation on boron-doped silicon surfaces was achieved using dynamic atomic force microscopy. This process is reversible and allows for high-resolution imaging of atomic vacancies and dopant sites.

Keywords:
AFMSTMfunctionalizationmanipulationsemiconducting surfaces

More Related Videos

Residue-Free Fabrication of van der Waals Heterostructures of Two-Dimensional Materials
04:57

Residue-Free Fabrication of van der Waals Heterostructures of Two-Dimensional Materials

Published on: July 18, 2025

1.4K
Atomically Traceable Nanostructure Fabrication
12:35

Atomically Traceable Nanostructure Fabrication

Published on: July 17, 2015

9.3K

Related Experiment Videos

Last Updated: Apr 13, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

10.4K
Residue-Free Fabrication of van der Waals Heterostructures of Two-Dimensional Materials
04:57

Residue-Free Fabrication of van der Waals Heterostructures of Two-Dimensional Materials

Published on: July 18, 2025

1.4K
Atomically Traceable Nanostructure Fabrication
12:35

Atomically Traceable Nanostructure Fabrication

Published on: July 17, 2015

9.3K

Area of Science:

  • Surface Science
  • Atomic Force Microscopy
  • Computational Materials Science

Background:

  • Delta-doped silicon surfaces are crucial for advanced electronic devices.
  • Atomic-level control is essential for understanding and fabricating nanoscale structures.
  • Previous methods lacked the precision for reversible single-atom manipulation.

Purpose of the Study:

  • To investigate single atomic manipulation on a B:Si(111) surface.
  • To demonstrate the reversibility of atomic removal and replacement.
  • To achieve high-resolution imaging of atomic vacancies and dopant environments.

Main Methods:

  • Low-temperature dynamic atomic force microscopy (AFM) with a Kolibri sensor.
  • Controlled vertical probe displacement for atomic manipulation.
  • Density functional theory (DFT) simulations for mechanistic insights.

Main Results:

  • Successfully removed and replaced individual silicon adatoms, creating and filling vacancies.
  • Demonstrated complete reversibility of the atomic manipulation process.
  • Achieved high-resolution AFM images revealing subsurface Si dangling bond triplets around boron dopants.

Conclusions:

  • Single atomic manipulation is feasible on B:Si(111) surfaces using AFM.
  • The process allows for precise control and reversible modification of atomic structures.
  • Sharpened AFM tips, a byproduct of manipulation, enable detailed imaging of dopant-induced defects.