Morphologic differences observed by scanning electron microscopy according to the reason for pseudophakic IOL

Roberto Fernández-Buenaga1, Jorge L Alio, José M Ramírez

  • 1Vissum Corporation, Alicante - Spain.

Summary

Scanning electron microscopy (SEM) revealed varied surface changes on explanted intraocular lenses (IOLs). These morphological findings did not correlate with the reason for IOL removal, highlighting SEM

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