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Cross sections for track structure codes: volume versus surface transport.

M Dingfelder1, A Travia2

  • 1Department of Physics, East Carolina University, Mailstop 563, Greenville, NC 27858, USA dingfelderm@ecu.edu.

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Summary
This summary is machine-generated.

This study details electron transport models for Monte Carlo simulations, focusing on secondary electron emission from metal foils. The research implements inelastic cross-sections for copper into the PARTRAC code, analyzing volume and surface excitation models.

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Area of Science:

  • Physics
  • Materials Science
  • Computational Science

Background:

  • Monte Carlo track structure codes are crucial for simulating particle interactions in materials.
  • Understanding secondary electron emission is vital for various applications, including surface analysis and device design.
  • Accurate electron transport models are needed for reliable simulations.

Purpose of the Study:

  • To discuss cross-section calculations and transport models for Monte Carlo track structure codes.
  • To simulate secondary electron emission yields from thin metal foils.
  • To implement and analyze inelastic cross-sections for electron transport in copper.

Main Methods:

  • Developed and discussed cross-section calculations for electron transport.
  • Implemented inelastic cross-sections for volume (bulk) and surface electron transport in copper.
  • Utilized the PARTRAC code for Monte Carlo track structure simulations.
  • Simulated and analyzed volume and surface excitation models.

Main Results:

  • Presented inelastic cross-sections for electron transport in copper.
  • Successfully implemented these cross-sections into the PARTRAC code.
  • Analyzed simulation results for both volume and surface excitation models.

Conclusions:

  • The study provides a framework for improved electron transport simulations.
  • The implemented models enhance the accuracy of secondary electron emission yield predictions.
  • Further analysis of volume and surface excitation effects is supported by this work.