Objective differentiation of neonatal EEG background grades using detrended fluctuation analysis

Vladimir Matic1, Perumpillichira Joseph Cherian2, Ninah Koolen1

  • 1Department of Electrical Engineering (ESAT), STADIUS Centre for Dynamical Systems, Signal Processing and Data Analytics, KU Leuven Leuven, Belgium ; iMinds Medical IT Department Leuven, Belgium.

Summary

Multifractal detrended fluctuation analysis (MF-DFA) metrics effectively distinguish neonatal electroencephalograph (EEG) abnormalities. This novel approach offers a quantitative method for assessing brain states in sick newborns.