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Multilayer thin films with compositional PbZr0.52Ti0.48O3/Bi1.5Zn1.0Nb1.5O7 layers for tunable applications
Shihui Yu1, Lingxia Li1, Weifeng Zhang2
1School of Electronic and Information Engineering, Tianjin University, Tianjin 300072, P. R. China.
Multilayer thin films of lead zirconate titanate/bismuth zinc niobate (PZT/BZN) show excellent tunable dielectric properties. Four layers (PPBLs) demonstrate superior performance for tunable device applications.
Area of Science:
- Materials Science
- Solid State Physics
- Electrical Engineering
Background:
- Multilayer thin films are crucial for advanced electronic devices.
- Dielectric properties and tunability are key parameters for tunable devices.
Purpose of the Study:
- Investigate dielectric properties and tunability of PZT/BZN multilayer thin films.
- Optimize film structure for enhanced performance.
Main Methods:
- Fabrication of PZT/BZN multilayer thin films using pulsed laser deposition.
- Characterization of dielectric properties and tunability under varying electric fields.
Main Results:
- A PZT/BZN bilayer film (3:1 ratio) showed a dielectric constant of 490, loss tangent of 0.017, and 49.7% tunability.
- Four PZT/BZN layers (PPBLs) exhibited a dielectric constant of ~538, 53.3% tunability, and a low loss tangent of ~0.015.
Conclusions:
- The four PPBLs demonstrate excellent dielectric properties and tunability.
- These multilayer films are promising candidates for tunable electronic device applications.
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