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    This study introduces a new method for self-mixing interference (SMI) sensing, enabling simultaneous measurement of semiconductor laser (SL) parameters and target movement. This advancement improves high-resolution sensing capabilities in metrology.

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    Area of Science:

    • Optoelectronics
    • Metrology
    • Laser Physics

    Background:

    • Self-mixing interference (SMI) is utilized in sensing, with applications in semiconductor laser (SL) parameter estimation and external target metrology.
    • High-resolution sensing requires integrating knowledge from both SMI application categories.

    Purpose of the Study:

    • To propose an improved method for simultaneously measuring SL parameters and arbitrary target movement.
    • To enhance the capabilities of SMI-based sensing systems.

    Main Methods:

    • Derivation of a new matrix equation from the existing SMI model.
    • Construction of a measurement matrix using all available SMI signal data samples.
    • Application of the total least squares estimation approach for parameter estimation.

    Main Results:

    • Successful simultaneous measurement of SL parameters and target movement.
    • Validation of the proposed method through both simulations and experimental verification.

    Conclusions:

    • The developed method effectively integrates SL parameter estimation and target metrology within a single SMI framework.
    • This approach offers a pathway to more comprehensive and precise SMI-based sensing.