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Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
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Analysis of mid-infrared lasing in active random media
Optics Express
|May 14, 2015
Abstract:
Lasing behaviour of 2-dimensional active random structures, designed to work in the Mid-IR region, has been investigated at different input powers by varying the amount of scattering intensity. A Monte Carlo based simulation tool has been developed including a model to manage the optical amplification. The analysis of photon travel distance has been considered to show the random lasing behaviour with particular attention on lasing threshold at different scattering intensity. The simulated results are in agreement with experiments.

