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Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

Mykola Telychko1, Jan Berger2, Zsolt Majzik3

  • 1Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, CZ-16200 Prague, Czech Republic ; Charles University, Faculty of Mathematics and Physics, V Holešovičkách 2, Praha 8, Czech Republic.

Beilstein Journal of Nanotechnology
|May 16, 2015
PubMed

Keywords:
AFMSTMSiCelectron scatteringgraphene

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