Time-dependent mechanical-electrical coupled behavior in single crystal ZnO nanorods
Yong-Jae Kim1, Tae Gwang Yun2, In-Chul Choi3
11] Division of Materials Science and Engineering, Hanyang University, Seoul 133-791, Korea [2] Graduate School of EEWS, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea.
Scientific Reports
|May 19, 2015
Summary
This study explores how zinc oxide (ZnO) nanorods change electrically during mechanical stress over time. Researchers found that ZnO nanorod resistance decreases with time-dependent deformation, crucial for flexible device reliability.
Area of Science:
- Materials Science
- Nanotechnology
- Solid-State Physics
Background:
- Long-term reliability of zinc oxide (ZnO) nanorod-based flexible devices is critical.
- Understanding the mechanical-electrical coupling at the nanoscale is essential for predicting device performance over time.
Purpose of the Study:
- To systematically investigate the time-dependent mechanical-electrical coupled behavior of single crystal ZnO nanorods.
- To explore the impact of creep deformation on the electrical properties of ZnO nanorods.
Main Methods:
- Performed compression creep tests on vertically-grown single crystal ZnO nanorods.
- Conducted in-situ electrical measurements, including current (I)-voltage (V) curve analysis before, during, and after creep tests.
- Analyzed I-V curves using thermionic emission-diffusion theory to extract nanorod resistance.
Main Results:
- Observed a non-negligible increase in current (I) due to time-dependent deformation.
- Demonstrated that nanorod resistance decreases as a function of time-dependent deformation.
- Developed and validated a simple analytical model correlating creep strain with resistance reduction.
Conclusions:
- Time-dependent deformation significantly influences the electrical resistance of ZnO nanorods.
- The proposed analytical model accurately predicts the reduction in nanorod resistance based on creep strain and diffusional mechanisms.
- Findings are vital for the design and long-term reliability assessment of ZnO nanorod-based flexible electronics.
