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Updated: Apr 12, 2026

A 3D-printed Chamber for Organic Optoelectronic Device Degradation Testing
Published on: August 10, 2018
Thermally triggered degradation of transient electronic devices
Chan Woo Park1, Seung-Kyun Kang2, Hector Lopez Hernandez3
1Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
Abstract:
Thermally triggered transient electronics using wax-encapsulated acid, which enable rapid device destruction via acidic degradation of the metal electronic components are reported. Using a cyclic poly(phthalaldehyde) (cPPA) substrate affords a more rapid destruction of the device due to acidic depolymerization of cPPA.
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