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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Interplay between Switching Driven by the Tunneling Current and Atomic Force of a Bistable Four-Atom Si Quantum Dot

Shiro Yamazaki1, Keisuke Maeda2, Yoshiaki Sugimoto2

  • 1†The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.

Nano Letters
|June 2, 2015
PubMed

Keywords:
Atomic manipulationSi quantum dotatomic switchdensity functional theorynoncontact atomic force microscopyscanning tunneling microscopy

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