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Updated: Apr 10, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy

Naoya Shibata1, Scott D Findlay2, Hirokazu Sasaki3

  • 11] Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo 113-8656, Japan [2] Japan Science and Technology Agency, PRESTO, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan.

Scientific Reports
|June 13, 2015
PubMed

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