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3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
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Surface determination through atomically resolved secondary-electron imaging.

J Ciston1, H G Brown2, A J D'Alfonso2

  • 1National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.

Nature Communications
|June 18, 2015
PubMed
Summary
This summary is machine-generated.

This study introduces atomic-resolution secondary-electron microscopy for surface structure determination, revealing novel atomic arrangements and coordination in strontium titanate nanomaterials.

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Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Determining atomic structure of surfaces is crucial for materials science.
  • Existing methods face limitations with homogeneous crystals and surface-bulk registration.
  • Atomically resolved secondary-electron imaging offers potential for nanomaterials.

Purpose of the Study:

  • To utilize atomic-resolution secondary-electron microscopy for surface structure determination.
  • To investigate the c(6 × 2) reconstruction on strontium titanate (001).
  • To elucidate atomic registry and coordination at the surface.

Main Methods:

  • Atomic-resolution secondary-electron microscopy (AR-SEM).
  • Secondary-electron image simulations.
  • Density functional theory (DFT) calculations.
  • Aberration-corrected plan-view high-resolution transmission electron microscopy (HRTEM).

Main Results:

  • Detailed AR-SEM analysis of strontium titanate (001) surface reconstruction.
  • Identification of an amended surface-bulk registry.
  • Discovery of seven-fold coordinated strontium atoms within TiO5 units.
  • Demonstration of dielectric screening's role in secondary-electron generation.

Conclusions:

  • AR-SEM is a viable technique for surface structure determination.
  • The study reveals unexpected atomic configurations and coordination on strontium titanate surfaces.
  • Dielectric screening significantly influences secondary-electron emission processes.