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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

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Author Spotlight: Revolutionizing Microfluidics Through Microchannel Fabrication on Nanopaper

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The Nanotechnology Revolution

Marco A Zarbin¹

¹From the Institute of Ophthalmology and Visual Science, Rutgers-New Jersey Medical School, Rutgers University, Newark, NJ.

Asia-Pacific Journal of Ophthalmology (Philadelphia, Pa.)

|June 25, 2015

Summary

No abstract available in PubMed .

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