Fast, multi-frequency, and quantitative nanomechanical mapping of live cells using the atomic force microscope

Alexander X Cartagena-Rivera1, Wen-Horng Wang2, Robert L Geahlen3

  • 11] School of Mechanical Engineering, Purdue University, West Lafayette, Indiana, USA [2] Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana, USA.

Scientific Reports
|June 30, 2015
PubMed
Summary

We developed a faster Atomic Force Microscope (AFM) technique to measure cell mechanical properties. This advancement enables real-time study of cellular processes and cancer cell behavior, improving nanomechanical imaging throughput significantly.