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Related Concept Videos

Atomic Absorption Spectroscopy: Atomization Methods01:25

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Atomic Absorption Spectroscopy (AAS) atomizes samples through flame atomization or electrothermal atomization. Flame atomization typically involves a nebulizer and spray chamber assembly to combine the sample with a fuel–oxidant mixture, creating a fine aerosol mist that enters a burner. Typically, the fuel and oxidant are combined in an approximately stoichiometric ratio. However, for atoms that are easily oxidized, a fuel-rich mixture may be more advantageous. Only about 5% of the...
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Atomic Emission Spectroscopy: Interference01:30

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In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
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Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Related Experiment Video

Updated: Apr 8, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Observing Atoms at Work by Controlling Beam-Sample Interactions.

Christian Kisielowski1

  • 1Lawrence Berkeley National Laboratory, The Molecular Foundry & Joint Center for Artificial Photosynthesis, One Cyclotron Rd., Berkeley, CA, 94720, USA.

Advanced Materials (Deerfield Beach, Fla.)
|July 2, 2015
PubMed
Summary
This summary is machine-generated.

High-resolution transmission electron microscopy now captures dynamic behavior using controlled electron dose rates. This technique allows real-time, single-atom sensitive imaging of even delicate materials under various conditions.

Keywords:
beam-sample interactionsfunctional behaviortransmission electron microscopy (TEM)

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Area of Science:

  • Materials Science
  • Physics
  • Chemistry

Background:

  • High-resolution transmission electron microscopy (HRTEM) is crucial for atomic-level material analysis.
  • Observing dynamic processes in materials is often limited by radiation damage.
  • Controlling electron beam-sample interactions is key to overcoming these limitations.

Purpose of the Study:

  • To develop a method for controlling electron beam-sample interactions in HRTEM.
  • To enable the capture of functional behavior and dynamic responses in materials.
  • To achieve deep sub-Ångstrom resolution and single-atom sensitivity imaging.

Main Methods:

  • Utilizing tunable electron dose rates, from attoamperes per square-Ångstrom upwards.
  • Systematically increasing dose rates to stimulate and observe dynamic responses.
  • Performing real-time observations under varied pressure and temperature conditions within the microscope.

Main Results:

  • Successfully controlled beam-sample interactions to capture previously unknown details of functional behavior.
  • Delayed sample degradation significantly by using ultra-low electron dose rates.
  • Achieved real-time imaging with deep sub-Ångstrom resolution and single-atom sensitivity, even for radiation-sensitive samples.

Conclusions:

  • The developed HRTEM approach enables unprecedented observation of dynamic material processes.
  • Tunable electron dose rates offer a powerful tool for studying radiation-sensitive materials.
  • This technique opens new avenues for understanding material behavior at the atomic scale.