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Versatile atomic force microscopy setup combined with micro-focused X-ray beam

T Slobodskyy1, A V Zozulya2, R Tholapi1

  • 1Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg, Germany.

The Review of Scientific Instruments
|July 3, 2015
PubMed

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