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Updated: Apr 7, 2026

Dielectric RheoSANS — Simultaneous Interrogation of Impedance, Rheology and Small Angle Neutron Scattering of Complex Fluids
Published on: April 10, 2017
High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical
D E Tranca1, S G Stanciu1, R Hristu1
1Center for Microscopy - Microanalysis and Information Processing, University Politehnica of Bucharest.
Abstract:
A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine.

