Confocal Fluorescence Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Super-resolution Fluorescence Microscopy
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Updated: Apr 7, 2026

A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
Published on: May 30, 2016
Aurélie Jost1, Elen Tolstik1, Polina Feldmann1
1Institute of Physical Chemistry, Abbe Center of Photonics, Friedrich-Schiller University Jena, Jena, Germany; Leibniz-Institute of Photonic Technology, Jena, Germany.
Structured Illumination Microscopy (SIM) can now create clear images from thick fluorescent samples using a single focal plane. This new thick slice blind-SIM method overcomes out-of-focus light and improves resolution.
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