A highly sensitive, direct and label-free technique for Hg(2+) detection using Kelvin probe force microscopy

Chanho Park1, Kuewhan Jang, Sangmyung Lee

  • 1Department of Mechanical Engineering, Korea University, Seoul 136-701, Korea.

Nanotechnology
|July 9, 2015
PubMed
Summary

A new method using Kelvin probe force microscopy (KPFM) detects mercury ions (Hg2+) with high sensitivity. This label-free technique offers a practical approach for environmental and health monitoring.

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