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    Area of Science:

    • Materials Science
    • Condensed Matter Physics
    • Crystallography

    Background:

    • Coherent X-ray diffraction experiments with focused beams yield complex patterns.
    • These patterns are influenced by sample properties, scattering geometry, and X-ray optics.

    Purpose of the Study:

    • To develop and validate a Fourier-transform-based method for modeling 2D Bragg peak intensity distributions.
    • To apply this method to thin films under various Bragg scattering geometries using a Fresnel zone plate.

    Main Methods:

    • Utilized a Fourier-transform-based modeling approach.
    • Applied the model to analyze thin films illuminated by a Fresnel zone plate.
    • Investigated three distinct Bragg scattering geometries.

    Main Results:

    • The developed model accurately reproduced experimental coherent diffraction patterns.
    • Demonstrated successful modeling of nanodiffraction patterns under nonsymmetric Bragg conditions.

    Conclusions:

    • The Fourier-transform method provides a reliable way to model complex X-ray Bragg diffraction.
    • This capability is crucial for the advancement of nanofocused X-ray diffraction microscopy.