Related Experiment Video
Updated: Apr 7, 2026

09:46
Fabrication and Characterization of High-Q Silicon Nitride Membrane Resonators
Published on: August 8, 2025
1.4K
Ultra-high-Q thin-silicon nitride strip-loaded ring resonators
Optics Letters
|July 16, 2015
Summary
We developed novel silicon nitride (Si3N4) ring resonators on a silicon chip, achieving ultra-high quality factors. These strip-loaded devices minimize light scattering for enhanced performance in optical applications.
Area of Science:
- Photonics and Optical Engineering
- Materials Science and Engineering
- Integrated Optics
Background:
- Ring resonators are crucial for optical signal processing.
- Achieving ultra-high quality factors (UHQs) is essential for advanced photonic applications.
- Traditional silicon nitride (Si3N4) devices face limitations in performance and fabrication.
Purpose of the Study:
- To design, fabricate, and characterize novel thin Si3N4 ring resonators.
- To demonstrate the effectiveness of a strip-loaded configuration for enhanced optical performance.
- To explore the potential of these resonators for nonlinear optics and quantum computing.
Main Methods:
- Monolithic integration of Si3N4 on a silicon chip.
- Utilizing a strip-loaded resonator design to minimize lateral boundary scattering.
- Characterization of device performance at near-infrared (NIR) and C-band wavelengths.
Main Results:
- Achieved UHQs of 3.7×10^6 in the NIR and Q factors up to 9×10^5 in the C-band.
- Demonstrated performance with a significantly thinner Si3N4 guiding core (80 nm and 115 nm).
- Observed reduced scattering losses due to the absence of etched lateral boundaries.
Conclusions:
- The strip-loaded Si3N4 ring resonators offer a promising platform for high-performance integrated photonics.
- The achieved UHQs pave the way for applications in nonlinear frequency conversion and quantum computing.
- Further improvements are expected to enhance device applicability within the material's transparency window.

