You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Nov 23, 2025

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
Published on: March 22, 2024
Yanyan Wang1, Xiaodong Hu2, Linyan Xu2
1Tianjin Key Laboratory of Information Sensing & Intelligent Control, Tianjin University of Technology and Education, Tianjin, China.
A novel intelligent control method enhances atomic force microscopy (AFM) tip control by automatically adjusting parameters for faster, more accurate topography measurements. This robust approach improves imaging quality and reduces scanning time.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: