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Updated: Apr 6, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
We developed a new atomic layer deposition and microstructuring process to encapsulate nanoscale grating patterns, enhancing optical functionality and mechanical stability. This novel method overcomes limitations of existing techniques, achieving 97.5% transmission efficiency for a demonstrated transmission grating.
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