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Compensation of drift by using a multichannel integrated Young interferometer.

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    This study presents a novel drift compensation method for polymer-based integrated Young interferometer (YI) sensors. The technique significantly improves measurement accuracy in disturbed environments, enhancing diagnostic applications.

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    Area of Science:

    • Optoelectronics
    • Integrated Optics
    • Sensor Technology

    Background:

    • Polymer-based integrated Young interferometer (YI) sensor chips offer high sensitivity and mass-manufacturing potential.
    • Mechanical drifts currently limit the applicability of YI sensors in low-cost, rapid diagnostic readers due to the need for stabilized setups.

    Purpose of the Study:

    • To develop and demonstrate a method for compensating mechanical drift in multichannel integrated YI sensor chips.
    • To enhance the robustness and applicability of YI sensors in real-world, potentially disturbed measurement conditions.

    Main Methods:

    • Derivation of a drift compensation method utilizing a multichannel integrated YI chip with two reference channels.
    • Quantitative measurements using a three-channel integrated polymeric YI sensor chip under both undisturbed and mechanically disturbed conditions.

    Main Results:

    • The compensation method reduced intrinsic drift by up to 84% in an undisturbed setup.
    • In a mechanically disturbed setup, the method enabled separation of sample-induced phase-change responses from signals up to 161 times larger than the disturbed signal.

    Conclusions:

    • The proposed drift compensation method effectively mitigates mechanical disturbances in integrated YI sensors.
    • This advancement expands the potential for low-cost, rapid diagnostic applications of YI sensor technology.