Advanced method of phase shift measurement from variances of interferogram differences
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Updated: Apr 6, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Abstract:
A new approach to the problem of measuring the phase shift from variances of interferogram differences based on Fourier domain analysis is proposed. It is shown that the use of true variance of the interferogram differences and spatial apodization of interferograms increases the accuracy of the phase shift of the measurement. Numerical simulations and experiments are presented.
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