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Writing and Low-Temperature Characterization of Oxide Nanostructures
Published on: July 18, 2014
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Bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum
Francesco Lavini1,2, Nan Yang1,2,3, Rama K Vasudevan4
1National Research Council CNR-SPIN, University of Roma 'Tor Vergata', Rome I-00133, Italy.
Nanotechnology
|July 25, 2015
Abstract:
Scanning probe bias techniques have been used as a method to locally dope thin epitaxial films of La(2)CuO(4) (LCO) fabricated by pulsed laser deposition. The local electrochemical oxidation of LCO very efficiently introduces interstitial oxygen defects in the thin film. Details on the influence of the tip voltage bias and environmental conditions on the surface morphology have been investigated. The results show that a local uptake of oxygen occurs in the oxidized films.
