Enhancement of beam pulse controllability for a single-pulse formation system of a cyclotron

The single-pulse formation technique using a beam chopping system consisting of two types of high-voltage beam kickers was improved to enhance the quality and intensity of the single-pulse beam with a pulse interval over 1 μs at the Japan Atomic Energy Agency cyclotron facility. A contamination rate of neighboring beam bunches in the single-pulse beam was reduced to less than 0.1%. Long-term purification of the single pulse beam was guaranteed by the well-controlled magnetic field stabilization system for the cyclotron magnet. Reduction of the multi-turn extraction number for suppressing the neighboring beam bunch contamination was achieved by restriction of a beam phase width and precise optimization of a particle acceleration phase. In addition, the single-pulse beam intensity was increased by a factor of two or more by a combination of two types of beam bunchers using sinusoidal and saw-tooth voltage waveforms. Provision of the high quality intense single-pulse beam contributed to improve the accuracy of experiments for investigation of scintillation light time-profile and for neutron energy measurement by a time-of-flight method.