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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

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Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory.

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Area of Science:

  • Ultrafast electron diffraction (UED) and microscopy
  • Materials science
  • Chemical dynamics
  • Biological sciences

Background:

  • Ultrafast electron probes offer complementary capabilities to X-ray free-electron lasers.
  • High-brightness, relativistic electron beams with femtosecond pulse durations enable atomic-scale resolution of dynamic processes.

Purpose of the Study:

  • To report on the construction and performance of the SLAC mega-electron-volt (MeV) Ultrafast Electron Diffraction (UED) system.
  • To serve as the initial stage of the SLAC Ultrafast Electron Diffraction (UED) and microscopy Initiative.
  • To support ultrafast science experiments and advanced instrumentation development.

Main Methods:

  • Construction and commissioning of a new mega-electron-volt (MeV) Ultrafast Electron Diffraction (UED) system.
  • Operation at a 120-Hz repetition rate.
  • Performance characterization including reciprocal space resolution, temporal resolution, and machine stability.

Main Results:

  • The SLAC MeV UED system has been successfully constructed and commissioned.
  • The system demonstrates outstanding performance.
  • Key performance metrics such as resolution and stability have been evaluated.

Conclusions:

  • The SLAC MeV UED system represents a significant advancement in ultrafast electron scattering instrumentation.
  • The system is ready to support a wide range of ultrafast science experiments.
  • This development is a crucial step for the SLAC Ultrafast Electron Diffraction (UED) and microscopy Initiative.