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Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
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X-ray Photoelectron Spectroscopy of Isolated Nanoparticles

Olivier Sublemontier1, Christophe Nicolas2, Damien Aureau3

  • 1†CEA/IRAMIS/Laboratoire Francis Perrin, URA 2453, 91191 Gif-sur-Yvette, France.

The Journal of Physical Chemistry Letters
|August 18, 2015
PubMed

Keywords:
Isolated NanoparticlesNanocharacterizationSi/SiO2 interfaceSilicon NanocrystalsSynchrotron RadiationX-ray Photoelectron Spectroscopy

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