Related Experiment Video
Updated: Apr 5, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Defect-Electron Spreading on the TiO2(110) Semiconductor Surface by Water Adsorption
Zhen Zhang1, Ke Cao1, John T Yates1
1Department of Chemistry, University of Virginia, Charlottesville, Virginia 22904, United States.
Abstract:
The dissociative adsorption of water at oxygen-vacancy defect sites on the TiO2(110) surface spatially redistributes the defect electron density originally present at subsurface sites near the defect sites. This redistribution of defect-electrons makes them more accessible to Ti(4+) ions surrounding the defects. The redistribution of electron density decreases the O(+) desorption yield from surface lattice O(2-) ions in TiO2, as excited by electron-stimulated desorption (ESD). A model in which OH formation on defect sites redistributes defect electrons to neighboring Ti(4+) sites is proposed. This switches off the Knotek-Feibelman mechanism for ESD of O(+) ions from lattice sites. Conversely, enhanced O(+) reneutralization could also be induced by redistribution of defect electrons. The redistribution of surface electrons by adsorption is further verified by the use of donor and acceptor molecules that add or remove electron density.

