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On-chip phase measurement for microparticles trapped on a waveguide.

Firehun Tsige Dullo1, Olav Gaute Hellesø

  • 1Northern Research Institute, 9294 Tromsø, Norway. firehun.tsige.dullo@norut.no.

Lab on a Chip
|August 20, 2015
PubMed
Summary

This study introduces a new on-chip method using a waveguide Young interferometer to trap and measure polystyrene microparticles. The technique successfully identifies single particle trapping and measures phase changes for particle characterization.

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Area of Science:

  • Optics and Photonics
  • Nanotechnology
  • Biophysics

Background:

  • Optical trapping is crucial for manipulating micro- and nanoparticles.
  • On-chip interferometry offers sensitive detection methods.
  • Characterizing microparticles requires precise measurement techniques.

Purpose of the Study:

  • To develop and validate a novel on-chip method for trapping and characterizing polystyrene microparticles.
  • To investigate the relationship between microparticle size and phase change using a waveguide Young interferometer.
  • To identify single particle trapping events and analyze discrepancies between simulated and measured optical responses.

Main Methods:

  • Utilizing a waveguide Young interferometer for optical trapping.
  • Measuring the phase change induced by trapped polystyrene microparticles.

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  • Performing extensive simulations of phase change, waveguide transmission, and particle forces.
  • Comparing experimental measurements with simulation results.

    • Main Results:

    • Successful trapping and identification of single polystyrene microparticles.
    • Measured phase change of -0.13 rad for 7 μm particles, compared to a simulated value of -0.28 rad.
    • Simulations indicate phase change increases with diameter up to 7 μm, with resonance effects for larger particles.

    Conclusions:

    • The developed on-chip interferometer is a viable method for counting and characterizing trapped microparticles.
    • Discrepancies between simulated and measured phase changes highlight the need for further refinement of optical models.
    • The study provides insights into particle-waveguide interactions and potential sources of experimental error.