Atomic Fluorescence Spectroscopy
Atomic Force Microscopy
Atomic Emission Spectroscopy: Overview
Atomic Spectroscopy: Absorption, Emission, and Fluorescence
Mass Analyzers: Common Types
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Updated: Apr 5, 2026

Atomic Force Microscopy Investigations of DNA Lesion Recognition in Nucleotide Excision Repair
Published on: May 24, 2017
1National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Muffin-tin potentials, standard for extended X-ray absorption fine-structure (EXAFS) analysis, can quantitatively assess scattering geometries beyond the initial atomic cluster. This robust method enhances EXAFS data interpretation.
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