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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping.

William Whitley1, Chris Stock1, Andrew D Huxley1

  • 1Centre for Science at Extreme Conditions, Erskinne Williamson Building, Mayfield Road, Edinburgh EH9 3JZ, Scotland.

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|August 26, 2015
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Summary

This study introduces a novel setup combining a CCD detector and a six-axis goniometer. This system enhances X-ray diffraction analysis by improving crystal indexing and speeding up single crystal identification in polycrystalline samples.

Keywords:
grain mappinglaboratory-based Laue X-ray diffraction

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Area of Science:

  • Crystallography
  • Materials Science
  • Analytical Chemistry

Background:

  • Large-area CCD X-ray detectors offer advantages in indexing X-ray diffraction patterns due to increased spot detection.
  • However, their cost and limited range can be drawbacks compared to photographic plates.
  • The speed of CCD detectors is beneficial for identifying single crystals within polycrystalline structures.

Purpose of the Study:

  • To overcome limitations of current CCD detectors for X-ray diffraction analysis.
  • To enhance the utility of CCD detectors for both crystal indexing and single crystal identification.
  • To develop a more efficient method for analyzing polycrystalline samples.

Main Methods:

  • Integration of a CCD detector with a six-axis goniometer.
  • Compilation of X-ray diffraction images from multiple angles to create wide-angled views.
  • Automated sample scanning coupled with image processing techniques to generate grain maps.

Main Results:

  • The new setup facilitates easier orientation fitting during X-ray diffraction pattern indexing.
  • It significantly accelerates the process of finding single crystals within polycrystalline samples.
  • Generated grain maps provide a strategic approach for single crystal extraction.

Conclusions:

  • The combined CCD detector and goniometer system offers a versatile solution for X-ray diffraction studies.
  • This approach enhances efficiency in both indexing and single crystal identification.
  • It presents a valuable tool for researchers working with polycrystalline materials.