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X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
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A perfect crystal, in theory, has a uniform structure with the same unit cell and lattice points throughout. However, any deviation from this periodic arrangement is known as an imperfection or defect. These defects can be categorized into three types: point, line, and plane defects.Point defects occur when there is a deviation from the ideal due to missing atoms, displaced atoms, or additional atoms. These imperfections might occur due to imperfect packing during crystallization or because of...
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Imperfections in Crystal Structure: Stoichiometric Point Defects01:26

Imperfections in Crystal Structure: Stoichiometric Point Defects

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Schottky defects arise when some lattice points in a crystal, such as those in NaCl, remain unoccupied, creating lattice vacancies without disturbing the overall electrical neutrality of the crystal. This defect is common in ionic crystals where the positive and negative ions are similar in size, as seen in sodium chloride and cesium chloride. The presence of Schottky defects enables the crystal to conduct electricity to a small extent through an ionic mechanism. Electric fields cause nearby...
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Crystallographic Point Groups01:29

Crystallographic Point Groups

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Crystallographic point groups represent the various symmetry operations that can occur within crystals. They are unique in that at least one point will always remain unchanged during these actions. For instance, consider the triclinic system. This system, devoid of any axis or plane of symmetry, aligns with the C1 and Ci point groups.where Cᵢ is characterized solely by a center of inversion.Contrastingly, the monoclinic system introduces an element of symmetry. This system with one plane...
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Related Experiment Video

Updated: Apr 4, 2026

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

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Accounting for partiality in serial crystallography using ray-tracing principles.

Loes M J Kroon-Batenburg1, Antoine M M Schreurs1, Raimond B G Ravelli2

  • 1Crystal and Structural Chemistry, Bijvoet Center for Biomolecular Research, Utrecht University, Padualaan 8, 3584 CH Utrecht, The Netherlands.

Acta Crystallographica. Section D, Biological Crystallography
|September 2, 2015
PubMed
Summary
This summary is machine-generated.

A new method improves serial crystallography data by accurately modeling reflection partialities. This enhances diffraction data quality, bringing

Keywords:
EVALpartiality of still dataserial crystallography

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Area of Science:

  • Structural Biology
  • Crystallography
  • Biophysics

Background:

  • Serial crystallography uses single diffraction images from many crystals.
  • Estimating reflection partialities in serial crystallography has been challenging.

Purpose of the Study:

  • To develop and validate a method for modeling reflection partialities in serial crystallography.
  • To improve the quality of diffraction data obtained from serial crystallography.

Main Methods:

  • Utilized the ray-tracing diffraction-integration method EVAL.
  • Modeled partialities using crystal mosaicity, beam divergence, wavelength dispersion, crystal size, and interference function.
  • Compared results with conventional rotation data from a lysozyme crystal.

Main Results:

  • The EVAL method significantly improved data quality, reducing R factor from 26% to 4.7%.
  • Merging R(int) factor improved from 105% to 56%, approaching rotation data quality.
  • The method accurately accounts for partiality in observed intensities.

Conclusions:

  • The developed method effectively models partialities, a critical step for enhancing serial crystallography data.
  • This advancement brings serial crystallography data quality closer to that of conventional rotation methods.
  • Further improvements in model parameter accuracy are possible but the current method shows significant progress.