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Updated: Apr 4, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
An ultra-low noise optical head for liquid environment atomic force microscopy.
I Schlesinger1, K Kuchuk1, U Sivan1
1Department of Physics, and the Russell Berrie Nanotechnology Institute, Technion - Israel Institute of Technology, Haifa 3200003, Israel.
A new ultra-low noise optical head for dynamic atomic force microscopy (AFM) achieves sub-3 picometer noise levels. This advancement enables high-resolution imaging of hydration layers and ion organization at solid surfaces and biomolecules.
Area of Science:
- Surface science
- Nanotechnology
- Biophysics
Background:
- Atomic Force Microscopy (AFM) is crucial for nanoscale imaging.
- Existing AFM systems face limitations in noise and sensitivity for studying delicate surface phenomena.
- Understanding hydration layers and ion organization is vital for biomolecular and materials science.
Purpose of the Study:
- To present the design and performance of an ultra-low noise optical head for dynamic AFM.
- To enable high-resolution studies of hydration layers and ion organization.
- To improve signal stability and reduce noise in AFM measurements.
Main Methods:
- Developed an integrated optical head with a tip-sample distance noise below 3 pm.
- Utilized a helium-neon laser for enhanced signal stability and reduced optical noise.
- Implemented integral photothermal cantilever excitation for pure harmonic oscillations.
Main Results:
- Achieved optical beam deflection sensor sensitivity below 10 fm/√Hz up to 8.6 MHz.
- Demonstrated atomic resolution imaging of muscovite mica in aqueous solution.
- The new head is compatible with standard Multimode AFM systems and liquid cells.
Conclusions:
- The ultra-low noise optical head significantly enhances AFM capabilities for nanoscale surface studies.
- This technology facilitates detailed investigation of hydration layers and ion organization.
- The design offers improved performance and compatibility for advanced AFM applications.
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