Super-resolution Fluorescence Microscopy
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Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle
Published on: January 3, 2016
Pavel Sidorenko1, Ofer Kfir1, Yoav Shechtman1,2
1Department of Physics and Solid State Institute, Technion, Haifa 32000, Israel.
Sparsity-based imaging resolves ambiguity in one-dimensional (1D) phase retrieval, enhancing resolution beyond microscope limits. This experimental breakthrough improves Fourier measurement systems for applications like microchip defect diagnostics and ultrashort laser pulse analysis.
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