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Definitive molecular level characterization of defects in UiO-66 crystals

Christopher A Trickett1, Kevin J Gagnon2, Seungkyu Lee1

  • 1Department of Chemistry, University of California-Berkeley, Materials Sciences Division, Lawrence Berkeley National Laboratory, Kavli Energy Nanosciences Institute at Berkeley, Center for Global Science at Berkeley, Berkeley, CA 94720 (USA).

Angewandte Chemie (International Ed. in English)
|September 10, 2015
PubMed

Keywords:
UiO-66X-ray diffractionmetal-organic frameworkssingle crystalsstructure elucidation

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