Broadband interferometric characterization of divergence and spatial chirp
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Updated: Apr 3, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Abstract:
We demonstrate a spectral interferometric method to characterize lateral and angular spatial chirp to optimize intensity localization in spatio-temporally focused ultrafast beams. Interference between two spatially sheared beams in an interferometer will lead to straight fringes if the wavefronts are curved. To produce reference fringes, we delay one arm relative to another in order to measure fringe rotation in the spatially resolved spectral interferogram. With Fourier analysis, we can obtain frequency-resolved divergence. In another arrangement, we spatially flip one beam relative to the other, which allows the frequency-dependent beamlet direction (angular spatial chirp) to be measured. Blocking one beam shows the spatial variation of the beamlet position with frequency (i.e., the lateral spatial chirp).
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