Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

14.8K
Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...
14.8K
Atomic Force Microscopy01:08

Atomic Force Microscopy

4.7K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.7K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Direct all-electrical decoding of vector vortex beams on chip.

Science advances·2026
Same author

Room-Temperature Tuning and Probing of Fermi Polarons in Atomically Thin Semiconductors on a Plasmonic Metasurface.

ACS nano·2026
Same author

Adaptive tunneling photodiodes enable visual recognition in high-contrast scenes.

Science advances·2026
Same author

Evanescent field-modulated non-uniform optical phased array with large lateral steering angle.

Optics express·2026
Same author

Efficient and broadband long-wavelength infrared generation driven by erbium femtosecond laser.

Optics express·2026
Same author

First-principles study of structural, electronic, optical, mechanical, piezoelectric, and ferroelectric properties in AlScN.

Physical chemistry chemical physics : PCCP·2026

Related Experiment Video

Updated: Apr 3, 2026

High-resolution Fiber-optic Microendoscopy for in situ Cellular Imaging
13:49

High-resolution Fiber-optic Microendoscopy for in situ Cellular Imaging

Published on: January 11, 2011

35.3K

High-resolution fiber profilometer for hard-to-access areas.

Zhuang Liu, Qize Zhong, Xia Yu

    Applied Optics
    |September 15, 2015
    PubMed
    Summary

    A new fiber-based profilometer uses low-coherence interferometry to measure internal surface profiles in difficult areas. This high-resolution system enhances imaging for detailed analysis.

    Area of Science:

    • Optical Engineering
    • Metrology
    • Instrumentation

    Background:

    • Measuring internal surface profiles in hard-to-access areas presents significant challenges.
    • Existing profilometry techniques may lack the required resolution or accessibility for certain sample types.

    Purpose of the Study:

    • To develop a novel fiber-based profilometer for measuring internal surface profiles.
    • To achieve high lateral and vertical resolutions in challenging measurement scenarios.
    • To optimize the system for specific working distances and beam sizes.

    Main Methods:

    • Utilized low-coherence light interferometry for non-contact surface profiling.
    • Implemented a differentiation method to improve imaging resolution.
    • Optimized probe design parameters, including working distance and beam size.

    More Related Videos

    Multimodal Imaging and Spectroscopy Fiber-bundle Microendoscopy Platform for Non-invasive, In Vivo Tissue Analysis
    10:35

    Multimodal Imaging and Spectroscopy Fiber-bundle Microendoscopy Platform for Non-invasive, In Vivo Tissue Analysis

    Published on: October 17, 2016

    8.4K
    Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
    05:04

    Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

    Published on: June 13, 2023

    2.6K

    Related Experiment Videos

    Last Updated: Apr 3, 2026

    High-resolution Fiber-optic Microendoscopy for in situ Cellular Imaging
    13:49

    High-resolution Fiber-optic Microendoscopy for in situ Cellular Imaging

    Published on: January 11, 2011

    35.3K
    Multimodal Imaging and Spectroscopy Fiber-bundle Microendoscopy Platform for Non-invasive, In Vivo Tissue Analysis
    10:35

    Multimodal Imaging and Spectroscopy Fiber-bundle Microendoscopy Platform for Non-invasive, In Vivo Tissue Analysis

    Published on: October 17, 2016

    8.4K
    Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
    05:04

    Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

    Published on: June 13, 2023

    2.6K

    Main Results:

    • Successfully developed a fiber-based profilometer system.
    • Demonstrated enhanced lateral and vertical resolutions through the differentiation method.
    • Validated the system's performance, particularly its high-resolution capabilities.

    Conclusions:

    • The developed fiber-based profilometer is effective for measuring internal surface profiles in hard-to-access regions.
    • The system offers high-resolution imaging, overcoming limitations of conventional methods.
    • This technology has potential applications in various fields requiring precise surface metrology.