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Updated: Apr 3, 2026
Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy
Published on: November 28, 2014
Determination of High-Frequency Dielectric Constant and Surface Potential of Graphene Oxide and Influence of Humidity
Francisco C Salomão1, Evandro M Lanzoni2, Carlos A Costa2
1Departmento de Física, Universidade Federal do Ceará , P.O. Box 6030, 60455-900 Fortaleza - Ceará, Brazil.
Abstract:
We use Kelvin probe force microscopy (KPFM) and capacitance coupling (dC/dz) to study the electrical properties of graphene oxide (GO). We propose using the dC/dz signal to probe the high frequency dielectric constant of mono- and few-layer GO. Our measurements suggest that the dynamic dielectric constant of GO is on the order of εGO ≅ 3.0 ε0, in the high frequency limit, and independent of the number of GO layers. The measurements are performed at a humidity controlled environment (5% of humidity). The effects of increasing humidity on both the dC/dz and KPFM measurements are analyzed.
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