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Long-Wavelength Beam Steerer Based on a Micro-Electromechanical Mirror.

Anthony B Kos¹, Eyal Gerecht¹

¹National Institute of Standards and Technology, Boulder, CO 80305.

Journal of Research of the National Institute of Standards and Technology

|September 25, 2015

Summary

A novel micro-electro-mechanical system (MEMS) mirror system enables rapid, high-resolution long-wavelength imaging. This agile apparatus provides images in seconds, overcoming limitations of larger, slower conventional mirrors.

Keywords:

DSP MEMS image raster-scanning long-wavelength long-wavelength beams long-wavelength imaging quasi-optical coupling terahertz terahertz beams terahertz imaging terahertz switching elements

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Area of Science:

Optics and Photonics
Micro-electro-mechanical Systems (MEMS)

Background:

Conventional mirrors for long-wavelength beam scanning are too large for high-speed imaging applications.
Existing systems require minutes to hours for image acquisition, hindering real-time analysis.

Purpose of the Study:

To develop a smaller, more agile pointing apparatus for rapid long-wavelength beam steering and imaging.
To introduce a system capable of acquiring high-resolution images in seconds.

Main Methods:

Utilized a commercial micro-electro-mechanical system (MEMS) mirror.
Controlled the MEMS mirror with a high-performance digital signal processor (DSP) for high-speed raster scanning.
Focused long-wavelength radiation onto a 9mm², gold-coated MEMS mirror surface.

Main Results:

Achieved high-speed raster scanning of incident radiation.
Acquired undistorted, high spatial-resolution images of objects simultaneously with scanning.
Demonstrated the system's capability as a miniaturized, high-performance long-wavelength beam chopper for lock-in detection.

Conclusions:

The developed MEMS-based beam steerer offers a significant advancement for fast long-wavelength imaging.
The system provides a compact and agile solution, reducing image acquisition times dramatically.
The technology is versatile and can be applied to beam chopping for enhanced detection sensitivity.