The de Broglie Wavelength
Electron Microscope Tomography and Single-particle Reconstruction
X-ray Crystallography
Scanning Electron Microscopy
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Vladislav S Yakovlev1,2, Mark I Stockman1, Ferenc Krausz2,3
1Center for Nano-Optics and Department of Physics and Astronomy, Georgia State University, Atlanta, GA 30303, USA.
Ultrafast electron and X-ray diffraction reveal atomic-scale charge-density dynamics in materials. Simulations show this technique can uncover localized origins of optical and electronic phenomena in graphene.
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