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Updated: Apr 2, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Origin of Noise in Layered MoTe₂ Transistors and its Possible Use for Environmental Sensors
Yen-Fu Lin1, Yong Xu2, Che-Yi Lin1
1Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan.
Abstract:
Low-frequency current fluctuations are monitored and the mechanism of electric noise investigated in layered 2H-type α-molybdenum ditelluride transistors. The charge transport mechanism of electric noise in atomically thin transition-metal dichalcogenides is studied under different environments; the development of a new sensing functionality may be stimulated.
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