Speed optimized linear-mode high-voltage CMOS avalanche photodiodes with high responsivity
Optics Letters
|October 1, 2015
Summary
Optimized avalanche photodiodes (APDs) fabricated using lateral well modulation doping achieve higher bandwidths. These speed-optimized APDs show significant performance improvements for high-speed optical detection applications.
Area of Science:
- Electrical Engineering
- Materials Science
- Optoelectronics
Background:
- Avalanche photodiodes (APDs) are crucial for sensitive light detection.
- Standard high-voltage (HV) complementary metal-oxide-semiconductor (CMOS) processes offer a platform for integrated photonic devices.
- Optimizing APD design is essential for achieving higher operating speeds.
Purpose of the Study:
- To present two speed-optimized avalanche photodiodes (APDs).
- To investigate the impact of lateral well modulation doping on APD performance.
- To achieve enhanced bandwidths in APDs fabricated using a 0.35 μm HV CMOS process.
Main Methods:
- Fabrication of APDs in a 0.35 μm HV CMOS process.
- Implementation of lateral well modulation doping with varying effective doping concentrations (90% and 75%).
- Characterization of responsivity and -3dB bandwidth at different avalanche gains.
Main Results:
- High unamplified responsivity of 0.41 A/W at 670 nm was achieved.
- Optimized APDs demonstrated improved -3dB bandwidths of 1.02 GHz (75% doping) and 1.25 GHz (90% doping) at M=50.
- These bandwidths represent a significant increase compared to the unmodulated APD (850 MHz).
Conclusions:
- Lateral well modulation doping is an effective technique for enhancing APD speed.
- The optimized APDs offer superior bandwidth performance for high-speed applications.
- The 0.35 μm HV CMOS process is suitable for fabricating high-performance, speed-optimized APDs.
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