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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Interferometric Diffraction from Amorphous Double Films.

Aram Rezikyan1, James A Belcourt1, Michael M J Treacy1

  • 1Department of Physics,Arizona State University,Tempe,Arizona 85287,USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|October 3, 2015
PubMed
Summary
This summary is machine-generated.

Interference fringes in double-layer amorphous samples reveal phase gradients. Displacement decoherence is strong in electron scattering, limiting coherence length to 225 nm.

Keywords:
amorphous double layerinterference fringesinterferometric diffraction

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Area of Science:

  • Materials Science
  • Electron Microscopy
  • Condensed Matter Physics

Background:

  • Amorphous materials present unique challenges for diffraction analysis.
  • Understanding electron scattering in thin films is crucial for materials characterization.
  • Interference phenomena in diffraction patterns can provide insights into sample properties.

Purpose of the Study:

  • To investigate interference fringes in diffraction patterns from double-layer amorphous samples.
  • To analyze phase gradients and coherence effects in high-energy electron scattering.
  • To determine the effective illumination coherence length of the electron source.

Main Methods:

  • Utilizing an interferometric diffraction geometry with double-layer amorphous samples.
  • Analyzing microdiffraction patterns to observe interference fringes.
  • Correlating fringe fading with diffraction vector magnitude and layer separation.

Main Results:

  • Observed interference fringes reveal phase gradients within microdiffraction patterns.
  • Rapid fringe fading with increasing diffraction vector confirms strong displacement decoherence.
  • Fringe fading with layer separation yields an effective illumination coherence length of approximately 225 nm.
  • Measured coherence length is consistent with the expected value for a heated Schottky field emitter source.

Conclusions:

  • Displacement decoherence significantly impacts high-energy electron scattering in amorphous samples.
  • The effective illumination coherence length is limited by the electron source and sample interactions.
  • The study provides a method for characterizing coherence properties in electron microscopy of amorphous materials.