Preparation of Samples for Electron Microscopy
Overview of Microscopy Techniques
Scanning Electron Microscopy
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Updated: Apr 1, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Jungdae Kim1, Hyoungdo Nam1, Shengyong Qin1
1Department of Physics, The University of Texas, Austin, Texas 78712, USA.
We designed a compact low-temperature scanning tunneling microscope (STM) with in-situ sample preparation. This system achieves atomic resolution and observes superconducting properties, ideal for temperature-sensitive materials.
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