Comparison of two confocal micro-XRF spectrometers with different design aspects

Area of Science:

• Analytical Chemistry
• Materials Science
• Spectroscopy

Background:

• Confocal micro X-ray fluorescence (XRF) spectrometry is a powerful technique for elemental analysis.
• Developing advanced XRF spectrometers is crucial for enhancing spatial resolution and detection limits.
• Comparing different instrument designs is essential for understanding their respective strengths and applications.

Purpose of the Study:

• To develop and install two distinct confocal micro X-ray fluorescence spectrometers.
• To compare the performance of a high-resolution air-based system with a vacuum-optimized light element detection system.
• To evaluate the capabilities of these instruments for analyzing various samples, including cultural heritage and automotive materials.

Main Methods:

• Development and installation of two confocal micro XRF spectrometers at different institutions.
• Characterization of spatial resolution using single-element thin film reference samples (Al, Ti, Cr, Fe, Ni, Cu, Zr, Mo, Au).
• Determination of lower limits of detection using NIST standard reference material glass 1412.
• Analysis of paint layer and automotive steel samples, including depth profiling.

Main Results:

• The Osaka City University system demonstrated high spatial resolution in air.
• The Vienna University of Technology Atominstitut system showed optimized light element detection under vacuum, albeit with lower spatial resolution.
• Both instruments successfully analyzed paint samples, with depth profiling capabilities demonstrated.

Conclusions:

• The study successfully developed and compared two advanced confocal micro XRF spectrometers.
• The findings highlight the trade-offs between spatial resolution and light element detection capabilities in different instrument designs.
• The instruments are suitable for analyzing complex samples in fields such as cultural heritage and materials science.