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Updated: Jan 20, 2026

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
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Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

Published on: October 25, 2021

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Post-thinning using Ar ion-milling system for transmission electron microscopy specimens prepared by focused ion beam

Min-Hee Lee1, Kyou-Hyun Kim1

  • 1Advanced Process and Materials R&D Group, Incheon Regional Division, Korea Institute of Industrial Technology, Incheon, Republic of Korea.

Journal of Microscopy
|October 13, 2015
PubMed

Keywords:
Ar ion-milling rateconvergent beam electron diffraction (CBED)focused ion beam (FIB)symmetry quantificationtransmission electron microscopy (TEM)

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